Photo-Induced Emission Analysis to Identify Surface Contaminants
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October 1, 2021
The instrument identifies, quantifies, and characterizes contamination, even on irregularly shaped surfaces.
The instrument identifies, quantifies, and characterizes contamination, even on irregularly shaped surfaces such as aircraft.Langley Research Center, Hampton, Virginia
NASA Langley developed an instrument to measure low levels of contamination on curved or irregularly shaped surfaces. The instrument offers unique capabilities such as the ability to identify and quantify contamination and analyze multiple surfaces simultaneously. This information provides an analysis of surface cleanliness needed for more reliable adhesive bonding in applications such as lightweight aircraft.
The instrument directs ultraviolet (UV) radiation onto a surface, producing a small electric current. The instrument measures that current as it changes over a short time interval. By analyzing the current, the level of contamination on the surface and the identification of the contaminant species can be determined.
NASA is actively seeking licensees to commercialize this technology. Please contact NASA’s Licensing Concierge at This email address is being protected from spambots. You need JavaScript enabled to view it. or call us at 202-358-7432 to initiate licensing discussions. Follow this link here for more information.
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