Renesas Launches 28 nm Automotive MCU with Virtualization‑Assisted Safety Features

Renesas Electronics has announced the successful verification of a cutting‑edge automotive test chip, paving the way for next‑generation flash microcontrollers built on a 28 nm low‑power process.

The prototype microcontroller boasts four 600 MHz cores in a lock‑step configuration, a generous 16 MB flash memory, and a suite of virtualization‑assisted functions that enable multiple software components to coexist on a single chip without interference. This capability meets the stringent requirements of ISO 26262 ASIL D, the highest automotive safety integrity level.

To support ASIL D compliance, the chip incorporates an advanced built‑in self‑test (BIST) system, including a standby‑resume BIST (SR‑BIST) that operates during power‑down cycles to detect faults. Enhanced networking features, such as a Gigabit Ethernet interface, provide high‑speed data transfer for sensor payloads.

Renesas will showcase the test results in the session titled “A 28 nm 600 MHz Automotive Flash Microcontroller with Virtualization‑Assisted Processor for Next‑Generation Automotive Architecture Complying with ISO 26262 ASIL D” at the International Solid‑State Circuits Conference on February 18, 2019.

Building on this validated technology, Renesas plans to accelerate the development of new 28 nm flash MCUs, reinforcing its commitment to eco‑friendly, autonomous vehicles and a safer, more secure driving experience.